We have explained the difference between Deep Learning and Machine Learning in simple language with practical use cases.

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...

For about a decade, computer engineer Kerem Çamsari employed a novel approach known as probabilistic computing. Based on probabilistic bits (p-bits), it’s used to solve an array of complex ...